Berkeley Varitronics Systems, Inc. “BVS”, provider of advanced wireless solutions and products to the domestic and international wireless telecommunications industry, has announced the release of their 4G LTE (News - Alert) YellowFin analyzer.

The LTE YellowFin will allow field engineers to measure the RF integrity with advanced measurements such as Received Signal Strength Indicator “RSSI”, Carrier to Interference plus Noise Ratio “CINR” and Multipath, along with demodulating the LTE physical layer.  

The test tool also has full spectrum analysis capabilities in two available models covering 2.0-5.9 GHz or 700-2.0 GHz.  This allows the RF engineers to verify that the environment has minimal interference before fully deploying the wireless infrastructure.

"Time to market is critical for a carrier's success and both Verizon (News - Alert) Wireless and AT&T have an enormous investment in the 700 MHz licensed spectrum.  Their customer base has a never-ending desire for more bandwidth and faster speeds. For example, the amount of mobile data traffic is expected to grow 40x over the next five years," noted Scott Schober (News - Alert), BVS' president & CEO.

"We are proud to release the most advanced portable 4G LTE analyzer to the market. Our LTE offering follows on the heels of the successful YellowFin Mobile 802.16e and YellowFin Fixed 802.16d WiMAX (News - Alert) analyzers that have been used to build out WiMAX networks around the globe," added Schober.

IDC, a leading industry research firm, predicts a 32 percent compound annual growth rate “CAGR” for global mobile broadband connections, and LTE was forecast to have a CAGR of 471 percent.

BVS will be showcasing the LTE YellowFin at the 4G World Show in Chicago, October 18 - 21. The company will be located in Booth 213, McCormick Place West, Exhibit Hall F1.

Stefanie Mosca is a Web editor for TMCnet. Previously she worked as a freelance copy editor for Digital Surgeons LLC. She holds a master's degree in journalism from Quinnipiac University and a bachelor's degree in communication from the University of New Haven. To read more of her articles, please visit her columnist page.

Edited by Stefanie Mosca