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February 22, 2011

Altair Semiconductor, Alcatel-Lucent Conduct 4G LTE Interoperability Test

Altair Semiconductor, a developer of low power, small footprint and high performance 4G LTE chipsets, announced that its Time Division – Long Term Evolution (TD-LTE) solution, combining Altair's 4G LTE chipsets and Alcatel-Lucent's LTE infrastructure, has completed interoperability testing.

Following this development, Altair announced it will take part in several TD-LTE field trials in India and China. Altair offers the cost effective TD-LTE solution available in the market today, company officials said.

“Altair's TD-LTE solution is a highly mature and cost optimized TDD terminal chipset platform, providing a perfect complement for our infrastructure systems and best positioning us to capitalize on the expected growth of the TD-LTE industry,” said Doug Wolff, vice president, LTE End to End Solutions of Alcatel-Lucent, in a statement.

TD-LTE, a 4G wireless standard which was designed to operate in unpaired spectrum, is emerging as the de-facto 4G standard for TDD spectrum. Since China Mobile's selection of TD-LTE for its 4G service, TD-LTE has received support from leading carriers around the world.

“TD-LTE, specifically in emerging markets, represents the highest growth potential for LTE in the coming years, and is a strategic focus area for Altair,” said Eran Eshed, co-founder and VP of marketing and business development at Altair Semiconductor.

Altair partnered with Alcatel-Lucent for commercializing its TD-LTE products, and the company can now meet the performance and maturity expectations of their carrier customers. Pricing will be a key focus area for carriers in these markets.

Recently, Altair Semiconductor announced that interoperability testing and validation testing will be jointly conducted by Agilent Technologies and Altair. The Agilent PXT wireless communications test set and N6070A-series signaling conformance test software will be used in conjunction with Altair's 4G LTE chipset for the testing.


Rajani Baburajan is a contributing editor for MobilityTechzone. To read more of Rajani's articles, please visit her columnist page.

Edited by Janice McDuffee


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