At the upcoming Mobile World Congress in Barcelona, Spain, Feb. 27- March 1, premier measurement company Agilent Technologies Inc. will demonstrate its industry-first communications test and measurement solutions for LTE-Advanced, LTE, HSPA+, dual-carrier HSDPA, MIMO, multi-standard radio and voice over LTE, along with 2G/3G solutions for R&D, manufacturing and deployment.
"We strive to anticipate our customers' needs with first-to-market test solutions such as TD-LTE beamforming MIMO, 42-Mbps throughput test, multi-standard radio and high-throughput manufacturing test,” Guy Sene, president of Agilent's Electronic Measurement Group, said. “We are dedicated to helping them achieve a competitive advantage in their mobile communications R&D, manufacturing and deployment environments.”
At Mobile World Congress, Agilent experts will demonstrate how to perform RF and parametric tests to the latest standards for LTE and LTE-Advanced using Agilent LTE & LTE-Advanced signal-generation and analysis tools such as 89600 VSA software, X-Series signal analyzers (including the N9030A PXA and the N9020A MXA), SystemVue and Signal Studio software.
In addition, they will look at up to eight measurement channels for TD-LTE base-station RF antenna beam forming with the N7109A multichannel signal analyzer, said the supplier. Plus, the company experts will address the challenges of multi-standard radio per 3GPP Release 9 with the N9083A MSR X-Series measurement application operating on Agilent X-Series signal analyzers, including the N9030A PXA and the N9020A MXA, said Agilent.
Furthermore, according to Agilent, company experts will be on hand to show how to test 42-Mbps DC-HSDPA IP data throughput using the new E5515E platform for the 8960 wireless communications test set. According to Agilent, the experts will illustrate how to transform the manufacturing test environment to get new wireless devices to market faster while reducing cost of test with Agilent's new EXT wireless communications test set.
The proven EXT architecture, a part of Agilent's X-Series signal analyzers, features an advanced sequence analyzer optimized for high throughput non-signaling test techniques for 2G/3G/LTE and future wireless devices. A comprehensive suite of supporting software tools, including Sequence Studio, enhanced Signal Studio, chipset control, calibration and test software helps accelerate time-to-volume manufacturing.
Other challenges to be addressed include performance verification of LTE user equipment under controlled test conditions using Agilent's E6621A PXT wireless communications test set, wireless field tests using the 3-GHz to 20-GHz handheld spectrum analyzer series.
Ashok Bindra is a veteran writer and editor with more than 25 years of editorial experience covering RF/wireless technologies, semiconductors and power electronics. To read more of his articles, please visit his columnist page.Edited by
Carrie Schmelkin 
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